diff --git a/drivers/mtd/nand/mxc_nand.c b/drivers/mtd/nand/mxc_nand.c
index 76beea4..65b26d5 100644
--- a/drivers/mtd/nand/mxc_nand.c
+++ b/drivers/mtd/nand/mxc_nand.c
@@ -857,6 +857,17 @@
 	}
 }
 
+/* Define some generic bad / good block scan pattern which are used
+ * while scanning a device for factory marked good / bad blocks. */
+static uint8_t scan_ff_pattern[] = { 0xff, 0xff };
+
+static struct nand_bbt_descr smallpage_memorybased = {
+	.options = NAND_BBT_SCAN2NDPAGE,
+	.offs = 5,
+	.len = 1,
+	.pattern = scan_ff_pattern
+};
+
 static int __init mxcnd_probe(struct platform_device *pdev)
 {
 	struct nand_chip *this;
@@ -973,7 +984,10 @@
 		goto escan;
 	}
 
-	host->pagesize_2k = (mtd->writesize == 2048) ? 1 : 0;
+	if (mtd->writesize == 2048) {
+		host->pagesize_2k = 1;
+		this->badblock_pattern = &smallpage_memorybased;
+	}
 
 	if (this->ecc.mode == NAND_ECC_HW) {
 		switch (mtd->oobsize) {